Symposium D
Advanced Characterization of Materials at Atomic Level using Electrons, X-rays and Neutrons
This symposium pertains to the study and understanding of materials at the nanoscale using advanced microscopy and spectroscopy techniques. Here are some key aspects of the scope for such a symposium, some advanced techniques are listed under each catalogue for highlight.
Advanced Electron Microscopy Techniques
• High-resolution/Scanning transmission electron microscopy
• Environmental scanning electron microscopy
• Advanced electron diffraction techniques
• Electron energy loss spectroscopy
• Atomic probe tomography
X-ray characterization methods using synchrotron facility.
• X-ray diffraction (XRD)
• X-ray scattering
• X-ray photoelectron spectroscopy (XPS)
[1] HAXPES
[2] X-ray standing wave PES.
• X-ray absorption spectroscopy (XAS)
[1] High resolution XAFS
[2] XAS-Imaging
• X-ray emission spectroscopy (XES)
• Time-resolved X-ray techniques
[1] Hard-X-ray free-electron laser
[2] XTS
Neutron Scattering and Imaging
• Neutron diffraction
• Small-angle neutron scattering (SANS)
• Neutron imaging and tomography
Interdisciplinary approaches for understanding complex materials.
• Operando techniques for catalysis
• Novel materials synthesis
• Atomic level understanding of complex systems like multi-elemental alloys, ceramics and polymers
Information will be available soon!
Chair(s)
Wu Dongshuang (NTU, Singapore)
Co-Chair(s)
Lam Yeng Ming (NTU, Singapore)
Chris Boothroyd (NTU, Singapore)
Li Tong (Ruhr-Universität Bochum, Germany)
Osami Sakata (Spring-8 of National Inst. of Materials Science, Japan)
Scientific Advisor
Si-Young Choi (Pohang)
Correspondence
Yeng Ming Lam
Nanyang Technological University, Singapore
Email: ymlam@ntu.edu.sg