Peter Müller-Buschbaum (Technical University of Munich, Germany)
See Wee Chee (Fritz Haber Institute  of the Max Planck Society, Germany)
Arun Devaraj (Pacific Northwest National Laboratory, United States)
Martin Dove (Sichuan University, China)
Hongchu Du (Forschungszentrum Jülich GmbH, Germany)
Koji Harano (NIMS, Japan)
Zhehao Huang (South China University of Technology, China)
Daiju Matsumura (SPring-8, Japan)
Andre Mkhoyan (University of Minnesota, United States)
Yasumasa Takagi(SPring-8, Japan)
Akhil Tayal (NSLSII, USA)
Tomokazu Yamamoto (Kyushu University, Japan)

This symposium pertains to the study and understanding of materials at the nanoscale using advanced microscopy and spectroscopy techniques. Here are some key aspects of the scope for such a symposium, some advanced techniques are listed under each catalogue for highlight.

Advanced Electron Microscopy Techniques
• High-resolution/Scanning transmission electron microscopy
• Environmental scanning electron microscopy
• Advanced electron diffraction techniques
• Electron energy loss spectroscopy
• Atomic probe tomography

X-ray characterization methods using synchrotron facility.
• X-ray diffraction (XRD)
• X-ray scattering
• X-ray photoelectron spectroscopy (XPS)
[1] HAXPES
[2] X-ray standing wave PES.
• X-ray absorption spectroscopy (XAS)
[1] High resolution XAFS
[2] XAS-Imaging
• X-ray emission spectroscopy (XES)
• Time-resolved X-ray techniques
[1] Hard-X-ray free-electron laser
[2] XTS

Neutron Scattering and Imaging
• Neutron diffraction
• Small-angle neutron scattering (SANS)
• Neutron imaging and tomography

Interdisciplinary approaches for understanding complex materials.
• Operando techniques for catalysis
• Novel materials synthesis
• Atomic level understanding of complex systems like multi-elemental alloys, ceramics and polymers